Amethyst employs a 2.5KeV Van de Graaff accelerator, with both macro and micro beam lines, that transports high-energy ion beams for the characterization of various material properties. Ion beam techniques used to analyze the composition, structure, and impurity content of materials include Rutherford backscattering spectrometry (RBS), ion-channeling, Particle Induced X-ray Emission (PIXE) and Nuclear Reaction Analysis (NRA) in addition to its proprietary Amethyst Wafer Mapping (AWM).
In addition to our industry unique ion beam analysis technologies, the Amethyst suite of analytical tools includes atomic force microscopy (AFM) for characterizing surface topography and composition, Raman and Fourier transform infrared (FTIR) spectroscopy for near-surface evaluation of chemical composition and stress, in-situ x-ray photoelectron spectroscopy (XPS) for measuring the elemental composition and chemical state of a surface. Amethyst can also determine the electrical properties of materials using a four-point probe and Hall Probe to measure the spreading resistance or alternatively to determine carrier concentration-mobility and type.